The focus of the Topical Meeting is on
those novel techniques that are being
developed in order to meet the extensive
demands on optical imaging. The meeting
will be organised so as to allow
intensive discussions and a fruitful
exchange of ideas with a single session
of presentations and a poster session.
Specialised in scope and restricted in
number of participants, the Topical
Meeting will give you the opportunity to
easily establish contacts and to
initiate new business relations and
research collaborations.
This meeting is the 6th of the EOS
Topical Meeting Series on Advanced
Imaging Techniques. Former meetings took
place in Delft (2003), London (2005),
Lille (2007), Jena (2009) and Engelberg
(2010).
- Numerical image restoration
- Structured light illumination (SIM)
- Fluorescence superresolution
techniques (STORM, FRED, PALM, STED)
- Superresolving pupil-masks
- Nonlinear imaging
- Double and quadruple patterning
lithography
- Exoplanet detection
- Advanced nearfield methods (lenlets,
metamaterials, ...)
- Superresolution radar
